922 TEM


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Features ( System Ư¡ )
Convenience
Simple switch-over
from mode-to-mode without time consuming realignment :
Illumination
modes, Imaging modes and Diffraction modes
User
oriented operation :
Push button
operation using application defined macros.
User specific operating environments
Automation of all important functions :
Stage
control, Camera Control, Low-dose operation
Computer
control of all microscope units
Remote control
of all parameters
Full networking capabilities
Ergonomocally designed
Cheaper price
System Integration
Super brightness
gun
Unique Koehler illumination
Computer controlled condenser aperture
Two objective
lens option
Computer controlled, eucentric goniometer
In-Column OMEGA energy filter
Parfocal imaging
system
Computer controlled slit aperture
Full range of detectors and attachments
Versatility
High resolution,
elastic imaging with excellent contrast
Unrivalled
elastic and spectroscopic diffraction
Fast and
comprehensive high resolution elemental distribution imaging and EELS analysis
Leading edge EDX capabilities
Wide range of software
package for automation and analysis
Detector Flexibility
Analog image recording by sheetfilm camera
Digital
image recording ( TV/SIT cameras, SSCCD cameras, image plate, STEM BF/DF, SE,
BSE )
Elemental Analysis ( Serial EELS, Parallel
EELS, Imaging EELS, ESI, EDX )
LEO TEM 922 Software
