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Á¦Ç°¼Ò°³ > Nano World > Àüüº¸±â
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NanoWorld Þä´Â ½ºÀ§½º¿¡ º»»ç¸¦ µÎ°í ÀÖ´Â ¼¼°è ÃÖ°íÀÇ SPM(Scaning Probe Microscopy)
Application¿ëÀÇ Silicon Sensor(Probe/Tip)À» Á¦ÀÛÇÏ´Â AFM Probe ÀÀ¿ë ºÐ¾ß¿¡¼´Â ¼¼°èÀûÀÎ Marketshare¸¦
°¡Áö°í Àִ ȸ»ç·Î, ´ëºÎºÐÀÇ Well-known AFM ÀåºñÀÇ Probe¿¡´Â ȣȯÀÌ ÀüÇô ¹®Á¦°¡ ¾øÀ¸¸ç
±×¿Ü SpecialÇÑ °æ¿ì¿¡´Â UserÀÇ ¿ä±¸ »çÇ׿¡ µû¶ó ÁÖ¹® Á¦ÀÛµµ °¡´ÉÇϸç, ƯÈ÷ ´Ù¾çÇÑ
Á¾·ùÀÇ Sensor(Probe/Tip)À» º¸À¯Çϰí ÀÖÀ» »Ó¸¸¾Æ´Ï¶ó Alignment Chip °ú Calibration StandardsµîÀ» º¸À¯, ´Ù¾çÇÑ UserÀÇ ¿ä±¸¿¡
ºÎÈïÇϱâ À§ÇØ ÃÖ¼±ÀÇ ³ë·Â°ú ¿¬±¸¸¦ Çϴ ȸ»çÀÔ´Ï´Ù.
°¢Á¾ Scanning Probe(Tip) Á¾·ù
NanoWorld Þä´Â Pointprobe¢çseries
¿Í new Arrow™series ±×¸®°í Pyrex-Nitride SPM Probes¶ó´Â 3°¡Áö
TypeÀÇ Silicon SPM-Sensor ¿Í Alignment Chip,
Calibration Standards¸¦ Worldwide·Î °ø±ÞÇϰí ÀÖ½À´Ï´Ù.
1)
Pointprobe¢ç
Silicon-SPM Sensors Á¾·ù
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Contact mode
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Non-contact / Soft Tapping
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Magnetic Force Microscopy(MFMR) / Hard magnetic / Soft Magnetic (tipside)
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Force Modulation mode(FM)
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Electrostatic Force Microscopy(EFM)
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Special Development(Rounded & Plateau Tip / Tipless Cantilever)
2)
Arrow™ Silicon-SPM
Sensors Á¾·ù
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Contact mode
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Non-contact / Tapping mode
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Force Modulation mode
3)
Alignment Chip & Calibration Standards
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Lateral
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Height
  -
Flatness
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