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NanoWorld Þä´Â ½ºÀ§½º¿¡ º»»ç¸¦ µÎ°í ÀÖ´Â ¼¼°è ÃÖ°íÀÇ SPM(Scaning Probe Microscopy) Application¿ëÀÇ Silicon Sensor(Probe/Tip)À» Á¦ÀÛÇÏ´Â AFM Probe ÀÀ¿ë ºÐ¾ß¿¡¼­´Â ¼¼°èÀûÀÎ Marketshare¸¦ °¡Áö°í Àִ ȸ»ç·Î, ´ëºÎºÐÀÇ Well-known AFM ÀåºñÀÇ Probe¿¡´Â ȣȯÀÌ ÀüÇô ¹®Á¦°¡ ¾øÀ¸¸ç ±×¿Ü SpecialÇÑ °æ¿ì¿¡´Â UserÀÇ ¿ä±¸ »çÇ׿¡ µû¶ó ÁÖ¹® Á¦ÀÛµµ °¡´ÉÇϸç, ƯÈ÷ ´Ù¾çÇÑ Á¾·ùÀÇ Sensor(Probe/Tip)À» º¸À¯Çϰí ÀÖÀ» »Ó¸¸¾Æ´Ï¶ó Alignment Chip °ú Calibration StandardsµîÀ» º¸À¯, ´Ù¾çÇÑ UserÀÇ ¿ä±¸¿¡ ºÎÈïÇϱâ À§ÇØ ÃÖ¼±ÀÇ ³ë·Â°ú ¿¬±¸¸¦ Çϴ ȸ»çÀÔ´Ï´Ù.

°¢Á¾ Scanning Probe(Tip) Á¾·ù
NanoWorld Þä´Â Pointprobe¢çseries ¿Í new Arrow™series ±×¸®°í Pyrex-Nitride SPM Probes¶ó´Â 3°¡Áö TypeÀÇ Silicon SPM-Sensor ¿Í Alignment Chip, Calibration Standards¸¦ Worldwide·Î °ø±ÞÇϰí ÀÖ½À´Ï´Ù.

                1) Pointprobe¢ç Silicon-SPM Sensors Á¾·ù
                    - Contact mode
                    - Non-contact / Soft Tapping
                    - Magnetic Force Microscopy(MFMR) / Hard magnetic / Soft Magnetic (tipside)
                    - Force Modulation mode(FM)
                    - Electrostatic Force Microscopy(EFM)
                    - Special Development(Rounded & Plateau Tip / Tipless Cantilever)
                2) Arrow™ Silicon-SPM Sensors Á¾·ù
                    - Contact mode
                    - Non-contact / Tapping mode
                    - Force Modulation mode
                3) Alignment  Chip & Calibration Standards
                     - Lateral
                     - Height
                     - Flatness

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